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 BUZ 331
SIPMOS (R) Power Transistor
* N channel * Enhancement mode * Avalanche-rated
Pin 1 G
Pin 2 D
Pin 3 S
Type BUZ 331
VDS
500 V
ID
8A
RDS(on)
0.8
Package TO-218 AA
Ordering Code C67078-S3114-A2
Maximum Ratings Parameter Continuous drain current Symbol Values 8 Unit A
ID IDpuls
32
TC = 35 C
Pulsed drain current
TC = 25 C
Avalanche current,limited by Tjmax Avalanche energy,periodic limited by Tjmax Avalanche energy, single pulse
IAR EAR EAS
8 13 mJ
ID = 8 A, VDD = 50 V, RGS = 25 L = 16 mH, Tj = 25 C
Gate source voltage Power dissipation 570
VGS Ptot
20 125
V W
TC = 25 C
Operating temperature Storage temperature Thermal resistance, chip case Thermal resistance, chip to ambient DIN humidity category, DIN 40 040 IEC climatic category, DIN IEC 68-1
Semiconductor Group
Tj Tstg RthJC RthJA
-55 ... + 150 -55 ... + 150 1 75 E 55 / 150 / 56
C K/W
1
07/96
BUZ 331
Electrical Characteristics, at Tj = 25C, unless otherwise specified Parameter Symbol min. Static Characteristics Drain- source breakdown voltage Values typ. max. Unit
V(BR)DSS
500 3 0.1 10 10 0.6 4
V
VGS = 0 V, ID = 0.25 mA, Tj = 25 C
Gate threshold voltage
VGS(th)
2.1
VGS=VDS, ID = 1 mA
Zero gate voltage drain current
IDSS
1 100
A
VDS = 500 V, VGS = 0 V, Tj = 25 C VDS = 500 V, VGS = 0 V, Tj = 125 C
Gate-source leakage current
IGSS
100
nA 0.8
VGS = 20 V, VDS = 0 V
Drain-Source on-resistance
RDS(on)
VGS = 10 V, ID = 5.5 A
Semiconductor Group
2
07/96
BUZ 331
Electrical Characteristics, at Tj = 25C, unless otherwise specified Parameter Symbol min. Dynamic Characteristics Transconductance Values typ. max. Unit
gfs
5 8 1500 180 65 -
S pF 2300 270 100 ns 20 30
VDS 2 * ID * RDS(on)max, ID = 5.5 A
Input capacitance
Ciss Coss
-
VGS = 0 V, VDS = 25 V, f = 1 MHz
Output capacitance
VGS = 0 V, VDS = 25 V, f = 1 MHz
Reverse transfer capacitance
Crss
-
VGS = 0 V, VDS = 25 V, f = 1 MHz
Turn-on delay time
td(on)
VDD = 30 V, VGS = 10 V, ID = 3 A RGS = 50
Rise time
tr
65 100
VDD = 30 V, VGS = 10 V, ID = 3 A RGS = 50
Turn-off delay time
td(off)
260 340
VDD = 30 V, VGS = 10 V, ID = 3 A RGS = 50
Fall time
tf
75 100
VDD = 30 V, VGS = 10 V, ID = 3 A RGS = 50
Semiconductor Group
3
07/96
BUZ 331
Electrical Characteristics, at Tj = 25C, unless otherwise specified Parameter Symbol min. Reverse Diode Inverse diode continuous forward current IS TC = 25 C Inverse diode direct current,pulsed A 1.1 380 4 5 20 V 1.2 ns C Values typ. max. Unit
ISM VSD trr Qrr
TC = 25 C
Inverse diode forward voltage
VGS = 0 V, IF = 10 A
Reverse recovery time
VR = 100 V, IF=lS, diF/dt = 100 A/s
Reverse recovery charge
VR = 100 V, IF=lS, diF/dt = 100 A/s
Semiconductor Group
4
07/96
BUZ 331
Power dissipation Ptot = (TC)
Drain current ID = (TC) parameter: VGS 10 V
9 A
130 W 110
Ptot
100 90 80 70 60 50
ID
7 6 5 4 3
40 30 20 10 0 0 0 20 40 60 80 100 120 C 160 0 20 40 60 80 100 120 C 160 2 1
TC
TC
Safe operating area ID = (VDS) parameter: D = 0.01, TC = 25C
10 2
Transient thermal impedance Zth JC = (tp) parameter: D = tp / T
10 1
A
t = 8.2s p 10 s
K/W
ID
100 s
ZthJC
10 1
10 0
=V
DS
/I
D
1 ms
DS (o n)
10 -1 D = 0.50
10 ms
R
0.20 0.10 10 -2 single pulse 0.05 0.02 0.01
10
0
DC 10 -1 0 10 10 -3 -7 10
10
1
10
2
V 10
3
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
s 10
0
VDS
tp
Semiconductor Group
5
07/96
BUZ 331
Typ. output characteristics ID = (VDS) parameter: tp = 80 s
18 A
l Ptot = 125W
Typ. drain-source on-resistance RDS (on) = (ID) parameter: VGS
2.6
ki j hg f e
VGS [V] a 4.0
b c 4.5 5.0 5.5 6.0 6.5 7.0 7.5 8.0 9.0
2.2
a
b
c
d
ID
14 12 10 8 6 4 2
a c
RDS (on)
2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0
VGS [V] =
a 4.0 4.5 b 5.0 c 5.5 d 6.0 e f 6.5 7.0 g 7.5 h i j k 8.0 9.0 10.0 20.0
d
d e f g h i j
e f h ij k g
k 10.0 l 20.0
b
0 0
4
8
12
16
20
24
28
V
34
0
2
4
6
8
10
12
14
A
18
VDS
ID
Typ. transfer characteristics ID = f (VGS)
Typ. forward transconductance gfs = f (ID)
parameter: tp = 80 s VDS2 x ID x RDS(on)max
10 A
parameter: tp = 80 s, VDS2 x ID x RDS(on)max
12 S 10
ID
8 7
gfs
9 8
6 5 4 3
7 6 5 4 3
2 2 1 0 0 1 0 1 2 3 4 5 6 7 8 V 10 0 1 2 3 4 5 6 7 A ID 9
VGS
Semiconductor Group
6
07/96
BUZ 331
Drain-source on-resistance RDS (on) = (Tj ) parameter: ID = 5.5 A, VGS = 10 V
3.4
Gate threshold voltage VGS (th) = (Tj) parameter: VGS = VDS, ID = 1 mA
4.6 V 4.0
RDS (on)
2.8
98%
VGS(th)
3.6 3.2 2.8 2.4
2.4 2.0
typ
2%
1.6 1.2 0.8
2.0
98% typ
1.6 1.2 0.8
0.4 0.0 -60
0.4 0.0 -60 -20 20 60 100 C 160
-20
20
60
100
C
160
Tj
Tj
Typ. capacitances
C = f (VDS) parameter:VGS = 0V, f = 1MHz
10 1
Forward characteristics of reverse diode IF = (VSD) parameter: Tj , tp = 80 s
10 2
nF C
A
IF Ciss
10 0 10 1
Coss
10 -1 10 0
Crss
Tj = 25 C typ Tj = 150 C typ Tj = 25 C (98%) Tj = 150 C (98%)
10 -2 0
5
10
15
20
25
30
V VDS
40
10 -1 0.0
0.4
0.8
1.2
1.6
2.0
2.4
V
3.0
VSD
Semiconductor Group
7
07/96
BUZ 331
Avalanche energy EAS = (Tj ) parameter: ID = 8 A, VDD = 50 V RGS = 25 , L = 16 mH
600 mJ
Typ. gate charge VGS = (QGate) parameter: ID puls = 12 A
16
V 500
EAS
450 400
VGS
12
10 350 300 250 6 200 150 100 2 50 0 20 0 40 60 80 100 120 C 160 0 20 40 60 80 nC 110 4 8 0,2 VDS max 0,8 VDS max
Tj
Q Gate
Drain-source breakdown voltage V(BR)DSS = (Tj )
600 V 580
V(BR)DSS 570
560 550 540 530 520 510 500 490 480 470 460 450 -60
-20
20
60
100
C
160
Tj
Semiconductor Group
8
07/96
BUZ 331
Package Outlines TO-218 AA Dimension in mm
Semiconductor Group
9
07/96


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